DocumentCode :
453487
Title :
Design and testing of frequency selective surfaces on thick silicon substrate operating at 600 GHz
Author :
Biber, S. ; Bozzi, M. ; Günther, O. ; Perregrini, L. ; Schmidt, L.-P.
Author_Institution :
Inst. for Microwave Technol., Erlangen Univ., Nuremberg, Germany
Volume :
1
fYear :
2005
fDate :
4-6 Oct. 2005
Abstract :
This paper describes the design and experimental verification of frequency selective surfaces, to be used as quasi-optical filters in the sub-millimeter wave range. They consist of a thin metal layer perforated periodically with rectangular or dogbone-shaped holes, and supported by a thick silicon substrate. A set of filters with pass-band at 600 GHz and stop-band at 750 GHz have been designed and tested. The design procedure based on the MoM/BI-RME method, the manufacturing of prototypes by standard processes available from the semiconductor industries, and their measurement by CW and THz time-domain spectroscopy are reported in this work. This class of filters is mechanically robust, presents low losses (1.4 dB), exhibits good reproducibility, and permits a fine tuning of the stop-band frequency by slightly changing the incidence angle.
Keywords :
band-pass filters; band-stop filters; frequency selective surfaces; silicon; submillimetre wave antennas; submillimetre wave filters; substrates; thick films; 1.4 dB; 600 GHz; 750 GHz; BI-RME; CW measurement; MoM; THz time-domain spectroscopy; design procedure; fine tuning; frequency selective surfaces; mechanically robust filter; passband filter; quasi-optical filters; stopband filter; Electronics industry; Filters; Frequency selective surfaces; Manufacturing processes; Measurement standards; Prototypes; Semiconductor device manufacture; Silicon; Substrates; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2005 European
Print_ISBN :
2-9600551-2-8
Type :
conf
DOI :
10.1109/EUMC.2005.1608926
Filename :
1608926
Link To Document :
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