Reliability evaluation of 5.2GHz CMOS receiver

A receiver´s reliability evaluation in relation to its circuit block degradation is investigated with our previously proposed device degradation sub-circuit model. The receiver´s performances are analyzed using both the analog parameters and digital parameters. The analog signal and digital signal degradation are monitored through two figure of merits parameters, SFDR and EVM, respectively. This work suggests that the hot-carrier induced LNA degradation leads to the SFDR degradation, meanwhile, causing EVM to decrease significantly. The VCO performance degradation results in minor impact on SFDR, but strong effects on the EVM.