DocumentCode
453580
Title
Backscattering from a spatial random permittivity plate: a statistical approach
Author
Dauron, G. ; Wong, M.F. ; Richalot, E. ; Picon, O. ; Wiart, J.
Author_Institution
France Telecom R&D, Issy les Moulineaux, France
Volume
2
fYear
2005
fDate
4-6 Oct. 2005
Abstract
This paper presents a way of finding a correlation between a scattering plate with spatial random permittivity and its far field diffraction diagram when illuminated by a plane wave. The random permittivity plate profile is generated using a pseudo 2D-Markov process. Far fields are processed with the fast multipole method. Similarities have been found between the distribution of permittivity on the plate and the associated far fields.
Keywords
Markov processes; backscatter; electromagnetic wave scattering; permittivity; statistical analysis; backscattering; far field diffraction diagram; fast multipole method; plane wave illumination; pseudo 2D-Markov process; spatial random permittivity plate; statistical approach; Autocorrelation; Backscatter; Base stations; Building materials; Concrete; Electromagnetic fields; Electromagnetic scattering; Glass; Magnetic materials; Permittivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2005 European
Print_ISBN
2-9600551-2-8
Type
conf
DOI
10.1109/EUMC.2005.1610179
Filename
1610179
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