• DocumentCode
    453649
  • Title

    High-performance and low-voltage challenges for sub-45nm microprocessor circuits

  • Author

    Krishnamurthy, Ram K. ; Mathew, Sanu K. ; Anders, Mark A. ; Hsu, Steven K. ; Kaul, Himanshu ; Borkar, Shekhar

  • Author_Institution
    Microprocessor Technol. Labs, Intel Corp., Hillsboro, OR, USA
  • Volume
    1
  • fYear
    2005
  • fDate
    24-27 Oct. 2005
  • Firstpage
    283
  • Lastpage
    286
  • Abstract
    Increasingly aggravated challenges in CMOS technology scaling beyond the 45nm node has resulted in several new design paradigm shifts necessary for high-performance and low-power microprocessors. This paper discusses some of the key technology challenges and the associated design paradigm shifts. High-performance and low-voltage energy-efficient circuit techniques to combat (i) increasing switching and active leakage power dissipation, (ii) poor leakage tolerance of large-signal cache arrays and register files, and (iii) worsening global on-chip interconnect scaling trend, are presented.
  • Keywords
    CMOS digital integrated circuits; integrated circuit interconnections; low-power electronics; microprocessor chips; CMOS technology; large signal cache arrays; low-power microprocessors; microprocessor circuits; on-chip interconnect; poor leakage tolerance; power dissipation; register files; CMOS technology; Central Processing Unit; Clocks; Dynamic voltage scaling; Frequency; Integrated circuit interconnections; Microprocessors; Paper technology; Registers; Repeaters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2005. ASICON 2005. 6th International Conference On
  • Print_ISBN
    0-7803-9210-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2005.1611299
  • Filename
    1611299