Title :
Data-Based Techniques Focused on Modern Industry: An Overview
Author :
Shen Yin ; Xianwei Li ; Huijun Gao ; Kaynak, Okyay
Author_Institution :
Res. Inst. of Intell. Control & Syst., Harbin Inst. of Technol., Harbin, China
Abstract :
This paper provides an overview of the recent developments in data-based techniques focused on modern industrial applications. As one of the hottest research topics for complicated processes, the data-based techniques have been rapidly developed over the past two decades and widely used in numerous industrial sectors nowadays. The core of data-based techniques is to take full advantage of the huge amounts of available process data, aiming to acquire the useful information within. Compared with the well-developed model-based approaches, data-based techniques provide efficient alternative solutions for different industrial issues under various operating conditions. The main objective of this paper is to review and summarize the recent achievements in data-based techniques, especially for complicated industrial applications, thus providing a referee for further study on the related topics both from academic and practical points of view. This paper begins with a brief evolutionary overview of data-based techniques in the last two decades. Then, the methodologies only based on process measurements and the model-data integrated techniques will be further introduced. The recent developments for modern industrial applications are, respectively, presented mainly from perspectives of monitoring and control. The new trends of data-based technique as well as potential application fields are finally discussed.
Keywords :
data integration; data processing; data-based techniques; model data integrated techniques; modern industry; process measurements; Adaptation models; Data models; Industries; Monitoring; Principal component analysis; Process control; Standards; Complicated industrial applications; data-based techniques; monitoring and control; overview;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2014.2308133