DocumentCode :
454364
Title :
Efficient Design Space Exploration of High Performance Embedded Out-of-Order Processors
Author :
Eyerman, Stijn ; Eeckhout, Lieven ; De Bosschere, Koen
Author_Institution :
Ghent Univ.
Volume :
1
fYear :
2006
fDate :
6-10 March 2006
Firstpage :
1
Lastpage :
6
Abstract :
Previous work on efficient customized processor design primarily focused on in-order architectures. However, with the recent introduction of out-of-order processors for high-end high-performance embedded applications, researchers and designers need to address how to automate the design process of customized out-of-order processors. Because of the parallel execution of independent instructions in out-of-order processors, in-order processor design methodologies which subdivide the search space in independent components are unlikely to be effective in terms of accuracy for designing out-of-order processors. In this paper we propose and evaluate various automated singleand multi-objective optimizations for exploring out-of-order processor designs. We conclude that the newly proposed genetic local search algorithm outperforms all other search algorithms in terms of accuracy. In addition, we propose two-phase simulation in which the first phase explores the design space through statistical simulation; a region of interest is then simulated through detailed simulation in the second phase. We show that simulation time speedups can be obtained of a factor 2.2times to 7.3times using two-phase simulation
Keywords :
electronic design automation; embedded systems; integrated circuit design; logic design; microprocessor chips; optimisation; search problems; design automation; design space exploration; embedded out-of-order processors; genetic local search algorithm; in-order processor design; multiobjective optimizations; parallel execution; Application software; Computational modeling; Design methodology; Design optimization; Genetics; Image segmentation; Multimedia systems; Out of order; Process design; Space exploration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
Type :
conf
DOI :
10.1109/DATE.2006.243735
Filename :
1656905
Link To Document :
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