Panel: Test and Reliability Challenges in Automotive Microelectronics

Author

Sebeke, C. ; Jung, Cheolkon ; Harbich, K. ; Fuchs, Stefan ; Schwarz, Josef ; Goehner, P.

Author_Institution

Robert Bosch GmbH, DE

Volume

1

fYear

2006

fDate

6-10 March 2006

Firstpage

1

Lastpage

1

Abstract

Summary form only given. Absolutely fail-safe operation in any critical situation, highest reliability in day-to-day operation and best-in-class convenience at a reasonable price: all drive innovation in automotive electronics. These goals result in car systems with ever-increasing complexity, challenging every single component, IC and line of code. As electronics´ failure rates are perceived to grow, we introduce root cause analysis, key technologies and new measures that enable carmakers to keep pace. The goal is to introduce test and reliability challenges and respective solutions for automotive systems. Representatives of car companies and suppliers explain their views and practical experiences

Keywords

automotive electronics; failure analysis; integrated circuit testing; automotive microelectronics; fail-safe operation; microelectronics reliability; root cause analysis; test technology; Automotive electronics; Automotive engineering; Failure analysis; Microelectronics; System testing; Technological innovation;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe, 2006. DATE '06. Proceedings

Conference_Location

Munich

Print_ISBN

3-9810801-1-4

Type

conf

DOI

10.1109/DATE.2006.243894

Filename

1656942