DocumentCode :
454413
Title :
A signal theory based approach to the statistical analysis of combinatorial nanoelectronic circuits
Author :
Soffke, Oliver ; Zipf, Peter ; Murgan, Tudor ; Glesner, Manfred
Author_Institution :
Inst. of Microelectron. Syst., Darmstadt Univ. of Technol.
Volume :
1
fYear :
2006
fDate :
6-10 March 2006
Abstract :
In this paper we present a method which allows the statistical analysis of nanoelectronic Boolean networks with respect to timing uncertainty and noise. All signals are considered to be instationary random processes which is the most general signal representation. As one cannot deal with random processes per se, we focus on certain statistical properties which are propagated through networks of Boolean gates yielding the instationary probability density function (pdf) of each signal in the network. Finally, several values of interest as the error probability, the average path delay or the average signal trace over time can be extracted from these pdf
Keywords :
combinational circuits; random processes; signal representation; statistical analysis; Boolean networks; combinatorial nanoelectronic circuits; instationary probability density function; noise; random processes; signal representation; signal theory; statistical analysis; timing uncertainty; Circuit noise; Delay effects; Error probability; Probability density function; Random processes; Signal processing; Signal representations; Statistical analysis; Timing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
Type :
conf
DOI :
10.1109/DATE.2006.244009
Filename :
1656964
Link To Document :
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