DocumentCode
454471
Title
Coverage Loss By Using Space Compactors in Presence of Unknown Values
Author
Chao, Mango C -T ; Wang, Seongmoon ; Chakradhar, Srimat T. ; Wei, Wenlong ; Cheng, Kwang-Ting
Author_Institution
Dept. of ECE, UC-Santa Barbara, Santa Barbara, CA
Volume
1
fYear
2006
fDate
6-10 March 2006
Firstpage
1
Lastpage
2
Abstract
The presence of unknown values in simulation is the greatest barrier to effective test response compaction. For space compactors, some responses may not be observable due to the masking effect caused by unknown values. This paper reports on experiments conducted to evaluate the impact on the test quality of various percentages of observable responses for both modeled and un-modeled faults
Keywords
automatic test pattern generation; compaction; fault diagnosis; logic testing; value engineering; coverage loss; effective test response compaction; masking effect; modeled faults; space compactors; stuck at faults; test pattern generation; test quality; unknown values; unmodeled faults; Benchmark testing; Chaos; Circuit faults; Circuit simulation; Circuit testing; Compaction; Electrical fault detection; Fault detection; National electric code; Radio access networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location
Munich
Print_ISBN
3-9810801-1-4
Type
conf
DOI
10.1109/DATE.2006.243930
Filename
1657047
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