DocumentCode
454482
Title
Minimizing Ohmic Loss and Supply Voltage Variation Using a Novel Distributed Power Supply Network
Author
Budnik, M. ; Roy, K.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
Volume
1
fYear
2006
fDate
6-10 March 2006
Firstpage
1
Lastpage
6
Abstract
IR and di/dt events may cause ohmic losses and large supply voltage variations due to system parasitics. Today, parallelism in the power delivery path is used to reduce ohmic loss while decoupling capacitance is used to minimize the supply voltage variation. Future integrated circuits, however, exhibit large enough currents and current transients to mandate additional safeguards. A novel, distributed power delivery and decoupling network is introduced reducing the supply voltage variation magnitude by 67% and the future ohmic loss by 15.9W (compared to today´s power delivery and decoupling networks) using conventional processing and packaging techniques in a 130nm technology node
Keywords
distribution networks; power supply circuits; transients; 130 nm; 15.9 W; current transients; decoupling capacitance; decoupling network; distributed power delivery; distributed power supply network; integrated circuits; ohmic loss; packaging techniques; power delivery path; supply voltage variation; Capacitors; Energy consumption; Inductance; Integrated circuit technology; Microprocessors; Packaging; Parasitic capacitance; Power generation; Power supplies; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location
Munich
Print_ISBN
3-9810801-1-4
Type
conf
DOI
10.1109/DATE.2006.243979
Filename
1657060
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