Test Compaction for Transition Faults under Transparent-Scan

Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application time for stuck-at faults. We show that similar advantages exist when considering transition faults. We first show that a test sequence under the transparent-scan approach can imitate the application of broadside tests for transition faults. Test compaction can proceed similar to stuck-at faults by omitting test vectors from the test sequence. A new approach for enhancing test compaction is also described, whereby additional broadside tests are embedded in the transparent-scan sequence without increasing its length or reducing its fault coverage