• DocumentCode
    45505
  • Title

    50+ Years of impedance measurement and spectroscopy, and implementation of virtual spectroscopy based on finite element analysis

  • Author

    Shilei Ma ; Boggs, Steven

  • Author_Institution
    Inst. of Mater. Sci., Univ. of Connecticut, Storrs, CT, USA
  • Volume
    30
  • Issue
    1
  • fYear
    2014
  • fDate
    January-February 2014
  • Firstpage
    25
  • Lastpage
    31
  • Abstract
    Impedance spectroscopy of dielectrics has a long history, going back to Heaviside. Modern multiphysics finite element analysis packages allow dielectric spectra to be computed from detailed physical models for comparison with measurements.
  • Keywords
    dielectric measurement; electric impedance measurement; finite element analysis; dielectric impedance spectroscopy; dielectric spectra; impedance measurement; multiphysics finite element analysis packaging; virtual spectroscopy; Capacitance; Current measurement; Dielectric measurement; Dielectrics; Frequency measurement; History; Spectroscopy; dielectric spectroscopy; impedance spectroscopy; time domain dielectric spectrometer;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0883-7554
  • Type

    jour

  • DOI
    10.1109/MEI.2014.6701104
  • Filename
    6701104