• DocumentCode
    456854
  • Title

    Characterizing temporal SNR variation in 802.11 networks

  • Author

    Guha, Ratul K. ; Sarkar, Saswati

  • Author_Institution
    Pennsylvania Univ., Philadelphia, PA
  • Volume
    3
  • fYear
    2006
  • fDate
    3-6 April 2006
  • Firstpage
    1408
  • Lastpage
    1413
  • Abstract
    The analysis and design of wireless MAC protocols, coding schemes and transmission algorithms can significantly benefit from an understanding of the channel quality variation. We attempt to represent channel quality variation using a finite state birth-death Markov model. We outline a method to compute the parameters of the model based on measured traces obtained using common wireless chipsets. Using this Markov chain, we evaluate the performance statistically based on the channel quality, long term correlations and burst length distributions. Such a model performs significantly better than a traditional two-state Markov chain in characterizing 802.11 networks while maintaining the simplicity of a birth-death model. We interpret the variation of the model parameters across different locations and different times. A finite state stationary model is amenable to analysis and can substantially benefit the design of efficient algorithms and make simulations for wireless network protocols faster
  • Keywords
    Markov processes; access protocols; channel coding; wireless LAN; 802.11 networks; burst length distributions; channel quality variation; coding schemes; finite state birth-death Markov model; finite state stationary model; temporal SNR variation; transmission algorithms; wireless MAC protocols; wireless chipsets; wireless network protocols; Algorithm design and analysis; Analytical models; Fading; Intelligent networks; Interference; Large-scale systems; Signal to noise ratio; Wireless LAN; Wireless application protocol; Wireless networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications and Networking Conference, 2006. WCNC 2006. IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1525-3511
  • Print_ISBN
    1-4244-0269-7
  • Electronic_ISBN
    1525-3511
  • Type

    conf

  • DOI
    10.1109/WCNC.2006.1696493
  • Filename
    1696493