DocumentCode :
45693
Title :
Electron Interference via a 4096-Pixel MAPS Detector Designed for High-Energy Physics Experiments
Author :
Balbi, G. ; Frabboni, S. ; Gabrielli, A. ; Gazzadi, G.C. ; Giorgi, F.M. ; Matteucci, Giovanni ; Semprini, N. ; Villa, M. ; Zoccoli, Antonio
Author_Institution :
Ist. Naz. di Fis. Nucleare, Sezione di Bologna, Bologna, Italy
Volume :
60
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
913
Lastpage :
917
Abstract :
A conventional transmission electron microscope is used as a versatile optical bench in a setup where a pixel recording system, sensitive to single electrons, replaces the final viewing screen. Our detector is based on a custom CMOS chip of 4096 monolithic active pixels designed for applications in vertex detectors of future collider experiments. The chip is equipped with a fast read-out chain able to manage up to 106 frames per second. This capability permitted to collect high statistics samples of single electron events within a time interval where the stable operations and the coherence conditions of the microscope were guaranteed. The microscope was configured with an accelerating potential of 60 kV, hence leading to 60 keV electrons. The large fraction of empty events made possible to obtain measurements of the time distribution of electron arrivals and this is what really characterizes this work. In fact, for the first time, conventional interference patterns have been split into single-electron frames according to the time of arrival. In particular, the 4096-pixel sensor has been used to collect diffraction patterns of a single wire, a carbon grating and eventually to reproduce the Young-Feynman two-slit experiment with single electrons instead of light. The experiment has been carried out by inserting two nanometric slits-two 100 × 1500 nm slits, 500 nm spaced apart-in the microscope that provided the electron beam source and the electro-optical lenses for projecting and focusing the pattern on the sensor. The fast readout of the sensor allowed us to record single-electron frames, spaced by several empty frames, and this is an improvement over past single-electron interference works. In this way the time distribution of the single electron arrivals has been measured with a timing resolution of 160 μs. This research might also open new detector investigation and development and characterization of pixel sensors.
Keywords :
diffraction; electron beams; high energy physics instrumentation computing; lenses; position sensitive particle detectors; readout electronics; transmission electron microscopy; CMOS chip; MAPS detector; Young-Feynman two-slit experiment; carbon grating; conventional interference patterns; conventional transmission electron microscope; diffraction patterns; electro-optical lenses; electron arrivals; electron beam source; electron volt energy 60 keV; empty events; fast read-out chain; high statistics samples; high-energy physics experiments; monolithic active pixels; nanometric slits; picture size 4096 pixel; pixel recording system; pixel sensor characterization; single electron arrivals; single electron events; single-electron frames; single-electron interference; stable operations; time distribution; time interval; versatile optical bench; vertex detectors; voltage 60 kV; Coherence; Detectors; Diffraction; Electron microscopy; Time measurement; Electron interference; Young´s experiment; pixel detector; transmission electron microscope (TEM);
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2214400
Filename :
6308737
Link To Document :
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