Title :
Combining global and local classifiers with Bayesian network
Author :
Nogueira, Lenildo ; Joao, M. ; De Carvalho, M.
Author_Institution :
Dept. of Comput. Sci., Fed. Univ. of Sergipe, Sao Cristovao
Abstract :
This paper introduces a classification method based on feature space segmentation. Since the classification task is equivalent to a probability distribution estimation, a Bayesian network is used as an inference mechanism for dealing with the underling probability distribution function that, presumably, is complex and factored. The article presents a method for splitting the feature space into regions that are associated to local classifiers. After that, a Bayesian network is used for combining their outputs. Experimental results reveal that this is a suitable approach for speeding up the training phase for large databases as well as to ensure good recognition rates
Keywords :
belief networks; computational complexity; feature extraction; inference mechanisms; pattern classification; statistical distributions; Bayesian network; feature space segmentation; inference mechanism; pattern classification; probability distribution estimation; Bayesian methods; Computer science; Distributed computing; Equations; Inference mechanisms; Multidimensional systems; Optical character recognition software; Pattern recognition; Probability distribution; Spatial databases;
Conference_Titel :
Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
0-7695-2521-0
DOI :
10.1109/ICPR.2006.386