Title :
Analysis of the effects of series filtering in coupled-strip sections
Author :
Pajares, Francisco-Javier ; Rodriguez-Cepeda, Pablo ; Ribó, Miquel ; Regué, Joan-Ramon ; Pradell, Lluis
Author_Institution :
Ramon Llull University
Keywords :
Circuit simulation; Circuit testing; Coupling circuits; Filtering; Impedance; Microstrip; Power harmonic filters; Signal analysis; Strips; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706259