DocumentCode
457568
Title
Calibration of electric probes for post-processing of near-field scanning data
Author
Tankielun, Adam ; Garbe, Heyno ; Werner, J.
Author_Institution
University of Paderborn
Volume
1
fYear
2006
fDate
14-18 Aug. 2006
Firstpage
119
Lastpage
124
Keywords
Calibration; Data engineering; Deconvolution; Electric variables measurement; Electromagnetic measurements; Magnetic field measurement; Probes; Systems engineering and theory; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location
Portland, OR, USA
Print_ISBN
1-4244-0293-X
Type
conf
DOI
10.1109/ISEMC.2006.1706276
Filename
1706276
Link To Document