DocumentCode :
457568
Title :
Calibration of electric probes for post-processing of near-field scanning data
Author :
Tankielun, Adam ; Garbe, Heyno ; Werner, J.
Author_Institution :
University of Paderborn
Volume :
1
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
119
Lastpage :
124
Keywords :
Calibration; Data engineering; Deconvolution; Electric variables measurement; Electromagnetic measurements; Magnetic field measurement; Probes; Systems engineering and theory; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706276
Filename :
1706276
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=457568
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