DocumentCode :
457577
Title :
Influence of an extended stub at connector ports on signal launches and TRL de-embedding
Author :
Jianmin Zhang ; Drewniak, James L. ; Pommerenke, David J. ; Zhiping Yang
Author_Institution :
University of Missouri
Volume :
1
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
172
Lastpage :
177
Keywords :
Calibration; Connectors; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Frequency measurement; Testing; Time domain analysis; Transmission line discontinuities; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706286
Filename :
1706286
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=457577
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