Title :
Correlation of radio frequency interference tests with low dropout voltage regulators
Author :
Rostamzadeh, Cyrous
Author_Institution :
Robert Bosch Corp.
Keywords :
Circuit testing; Electronic equipment testing; ISO standards; Immunity testing; Impedance; Low voltage; Radio frequency; Radiofrequency interference; Regulators; Resonance;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
DOI :
10.1109/ISEMC.2006.1706290