DocumentCode :
457605
Title :
Signal link-path characterization up to 20 GHz based on a stripline structure
Author :
Zhang, Jianmin ; Drewniak, James L. ; Pommerenke, David J. ; Dubroff, Richard E. ; Yang, Zhiping ; Cheng, Wheling ; Fisher, John ; Camerlo, Sergio
Author_Institution :
University of Missouri
Volume :
2
fYear :
2006
fDate :
14-18 Aug. 2006
Firstpage :
356
Lastpage :
361
Keywords :
Conducting materials; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Dispersion; Frequency; Material properties; Stripline;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
Conference_Location :
Portland, OR, USA
Print_ISBN :
1-4244-0293-X
Type :
conf
DOI :
10.1109/ISEMC.2006.1706327
Filename :
1706327
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=457605
