DocumentCode
459194
Title
On reliability of Applied level with Opportunity of MPLS Network Reconfiguration
Author
Tsurcanu, D.N.
Author_Institution
Tech. Univ. of Moldova, Kishinev
Volume
1
fYear
2006
fDate
Sept. 2006
Firstpage
332
Lastpage
333
Abstract
Reliability calculation of an applied level of MPLS network (multiprotocol label switching) is carried out on the basis of the semi-Markov device processes, taking into account an opportunity of reconfiguration and phase integration of a network in general
Keywords
Markov processes; multiprotocol label switching; telecommunication network reliability; MPLS network reconfiguration; multiprotocol label switching; phase integration; reliability calculation; semiMarkov device process; Hidden Markov models; Hydrogen; Magnetic flux leakage; Magnetic force microscopy; Microwave technology; Multiprotocol label switching; Organizing; Quality of service; Switches; Telecommunication switching;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
966-7968-92-8
Electronic_ISBN
966-7968-92-8
Type
conf
DOI
10.1109/CRMICO.2006.256413
Filename
4023718
Link To Document