Title :
On reliability of Applied level with Opportunity of MPLS Network Reconfiguration
Author_Institution :
Tech. Univ. of Moldova, Kishinev
Abstract :
Reliability calculation of an applied level of MPLS network (multiprotocol label switching) is carried out on the basis of the semi-Markov device processes, taking into account an opportunity of reconfiguration and phase integration of a network in general
Keywords :
Markov processes; multiprotocol label switching; telecommunication network reliability; MPLS network reconfiguration; multiprotocol label switching; phase integration; reliability calculation; semiMarkov device process; Hidden Markov models; Hydrogen; Magnetic flux leakage; Magnetic force microscopy; Microwave technology; Multiprotocol label switching; Organizing; Quality of service; Switches; Telecommunication switching;
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
DOI :
10.1109/CRMICO.2006.256413
