Title :
Design and Performance Evaluation of Overcurrent Protection Schemes for Silicon Carbide (SiC) Power MOSFETs
Author :
Zhiqiang Wang ; Xiaojie Shi ; Yang Xue ; Tolbert, Leon M. ; Fei Wang ; Blalock, Benjamin J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
Overcurrent protection of silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors (MOSFETs) remains a challenge due to lack of practical knowledge. This paper presents three overcurrent protection methods to improve the reliability and overall cost of SiC MOSFET-based converters. First, a solid-state circuit breaker (SSCB) composed primarily by a Si IGBT and a commercial gate driver IC is connected in series with the dc bus to detect and clear overcurrent faults. Second, the desaturation technique using a sensing diode to detect the drain-source voltage under overcurrent faults is implemented as well. Third, a novel active overcurrent protection scheme through dynamic evaluation of fault current level is proposed. The design considerations and potential issues of the protection methods are described and analyzed in detail. A phase-leg configuration-based step-down converter is built to evaluate the performance of the protection schemes under various conditions, considering variation of fault type, decoupling capacitance, protection circuit parameters, etc. Finally, a comparison is made in terms of fault response time, temperature-dependent characteristics, and applications to help designers select a proper protection method.
Keywords :
III-V semiconductors; circuit breakers; integrated circuit design; overcurrent protection; power MOSFET; silicon compounds; wide band gap semiconductors; IGBT; SiC; commercial gate driver IC; desaturation technique; drain source voltage; fault current level; fault response time; overcurrent faults; overcurrent protection schemes; phase leg configuration based step down converter; power MOSFET; solid state circuit breaker; temperature dependent characteristics; Capacitance; Circuit faults; Insulated gate bipolar transistors; Logic gates; MOSFET; Silicon carbide; Switches; Desaturation; overcurrent protection; silicon carbide (SiC) metal??oxide??semiconductor field-effect transistors (MOSFETs); solid-state circuit breaker (SSCB);
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2013.2297304