Title :
A Study on Evaluating Authentication Traffics in the Next Generation Wireless Networks
Author :
Zhang, Yan ; Zhou, Mingtuo ; Xiao, Shaoqiu ; Fujise, Masayuki
Author_Institution :
Wireless Communications Laboratory, NICT Singapore, National Institute of Information and Communications Technology. Email: yanzhang@ieee.org
Abstract :
There are two major contributions in this paper. The first is to exam the Poisson assumption for the authentication traffic process triggered by the location update (LU) requests. For this, we develop an analytical model and efficient, recursive algorithm to derive the LU inter-arrival time in static as well as dynamic location management scheme. The analysis is validated by simulation and the numerical investigation indicates that the Poisson process is invalid in approximating the authentication requests. The second goal is to investigate the issue: whether different mobility management schemes have a significant effect on the authentication traffic evaluation. To answer this, we propose a system model to incorporate different LU policies. Via simulation, we evaluate the authentication traffics under static and dynamic location management schemes. The comparison demonstrates that, due to the diverse network architecture as well as the different event triggering LU message, there are significant discrepancy in generating authentication traffic load. The result reveals the fact that the performance of security management and the mobility management in wireless mobile networks interact with each other.
Keywords :
3G mobile communication; Analytical models; Authentication; Ground penetrating radar; Mobile radio mobility management; Next generation networking; Peer to peer computing; Telecommunication traffic; Traffic control; Wireless networks; HLR/AuC; SGSN; Third generation; UMTS; authentication and key agreement (AKA); location update; mutual authentication; registration area; registration area residence time; security management;
Conference_Titel :
Communications, 2006. ICC '06. IEEE International Conference on
Conference_Location :
Istanbul
Print_ISBN :
1-4244-0355-3
Electronic_ISBN :
8164-9547
DOI :
10.1109/ICC.2006.255540