Title :
Field Data-based Study on Electric Arc Furnace Flicker Mitigation
Author :
Han, Chong ; Huang, Alex Q. ; Bhattacharya, Subhashish ; Ingram, Mike
Author_Institution :
Semicond. Power Electron. Center, North Carolina State Univ., Raleigh, NC
Abstract :
As an industry customer of utility, electrical arc furnace (EAF), acting as a varying and reactive power sink, is the major flicker source to influence the grid power quality. In this paper, based on the field data recorded at the electric system surrounding EAF, the flicker issues and reactive power compensation requirement are quantitatively analyzed. The possible compensation solutions, including passive filter, SVC (static Var compensator), STATCOM (static synchronous compensator) are discussed. Furthermore, a field data-based EAF model is proposed and implemented in the simulation software. The fast-bandwidth STATCOM solution with or without capacitor bank are designed and implemented. With the validated EAF and STATCOM model, the extensive simulations are conducted to study compensator performance and cost-effectiveness for EAF flicker mitigation. Finally, the guideline for compensator selection and performance estimation is obtained
Keywords :
arc furnaces; compensation; flicker noise; passive filters; power capacitors; power harmonic filters; power system harmonics; power system simulation; static VAr compensators; STATCOM model; capacitor bank; compensator performance estimation; compensator selection; electric arc furnace; field data; flicker mitigation; grid power quality; passive filter; reactive power compensation; reactive power sink; simulation software; static Var compensator; static synchronous compensator; varying power sink; Automatic voltage control; Capacitors; Furnaces; Guidelines; Passive filters; Power quality; Power system modeling; Reactive power; Static VAr compensators; Voltage fluctuations; Electrical Arc Furnace (EAF); STATCOM; flicker mitigation;
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
DOI :
10.1109/IAS.2006.256495