DocumentCode
459817
Title
Ac impedance measurement by line-to-line injected current
Author
Huang, J. ; Corzine, K.A.
Author_Institution
Dept. of Electr. Eng., Missouri Univ., Rolla, MO
Volume
1
fYear
2006
fDate
8-12 Oct. 2006
Firstpage
300
Lastpage
306
Abstract
Naval ship as well as aerospace power systems are incorporating a greater degree of power electronic switching sources and loads. Although these components provide exceptional performance, they are prone to instability due to their high efficiency and constant power characteristics which lead to a negative impedance nature. When designing these systems, system integrators must consider the impedance versus frequency at an interface (which designates source and load). Stability criteria have been developed in terms of source and load impedance for both DC and AC systems and it is often helpful to have techniques for impedance measurement. For DC systems, the measurement techniques have been well established. This paper introduces a new method of impedance measurement for three-phase AC systems. By injecting a line-to-line (unbalanced without zero sequence) current between two lines of the AC system, all impedance information may be determined. Since the current injection is line-to-line, the measurement device may be used for AC or DC interfaces. Simulation and laboratory measurements demonstrate the effectiveness of this new technique
Keywords
electric impedance measurement; network synthesis; power electronics; power system planning; systems engineering; AC impedance measurement; AC interface; DC interface; aerospace power systems; line-to-line injected current; naval ship power system; power electronic switching; three-phase AC systems; Aerospace electronics; Current measurement; Frequency; Impedance measurement; Laboratories; Marine vehicles; Measurement techniques; Power electronics; Power system measurements; Stability criteria; Power electronic; impedance measurement; stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location
Tampa, FL
ISSN
0197-2618
Print_ISBN
1-4244-0364-2
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/IAS.2006.256539
Filename
4025224
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