DocumentCode :
459840
Title :
Junction Temperature Prediction of a Multiple-chip IGBT Module under DC Condition
Author :
Wei, Lixiang ; Kerkman, Russ J. ; Lukaszewski, Richard A. ; Brown, Brian P. ; Gollhardt, Neil ; Weiss, Bruce W.
Author_Institution :
Rockwell Autom., Mequon, WI
Volume :
2
fYear :
2006
fDate :
8-12 Oct. 2006
Firstpage :
754
Lastpage :
762
Abstract :
This paper develops a thermal model for a six-pack insulated gate bipolar transistor (IGBT) power module operating as a three phase voltage source inverter. With this model, the temperature of each chip can be derived directly from the losses of the silicon chips and a thermal impedance matrix. The losses of each chip can be calculated through the voltage and current information of the power module. The impedance model can be easily transferred into a micro-processor to predict the online chip temperatures. It largely increases the temperature accuracy when the inverter operates at zero or low output frequency. Theory analysis, simulation and experimental results are provided to verify the effectiveness of this model
Keywords :
insulated gate bipolar transistors; invertors; microprocessor chips; multichip modules; thermal analysis; 3-phase voltage source inverter; insulated gate bipolar transistor; junction temperature; multiple chip module; thermal impedance matrix; thermal network; Analytical models; Frequency; Impedance; Insulated gate bipolar transistors; Inverters; Multichip modules; Predictive models; Silicon; Temperature; Voltage; DC condition; Junction temperature; impedance matrix model; multiple chip module; thermal network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2006. 41st IAS Annual Meeting. Conference Record of the 2006 IEEE
Conference_Location :
Tampa, FL
ISSN :
0197-2618
Print_ISBN :
1-4244-0364-2
Electronic_ISBN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2006.256611
Filename :
4025297
Link To Document :
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