• DocumentCode
    45994
  • Title

    Experimental and Theoretical Investigation of Pump Laser Induced Thermal Damage for Polycrystalline Ceramic and Crystal Nd:YAG

  • Author

    Yu Shen ; Yong Bo ; Nan Zong ; Ya-Ding Guo ; Qin-Jun Peng ; Jiang Li ; Yu-Bai Pan ; Jing-Yuan Zhang ; Da-Fu Cui ; Zu-Yan Xu

  • Author_Institution
    Key Lab. of Functional Crystal & Laser Technol., Univ. of Chinese Acad. of Sci., Beijing, China
  • Volume
    21
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan.-Feb. 2015
  • Firstpage
    160
  • Lastpage
    167
  • Abstract
    Continuous wave 808-nm pump laser induced thermal damage of polycrystalline ceramic and crystalline Nd:YAG materials were investigated both experimentally and theoretically in this paper. The measured temperature agrees well with the theoretical simulation and the maximum hoop stress occurs on the incident facet of the end pumped rod at about √2 times of the pump beam radius w0, where the temperature gradient is the highest and the damage occurs first. The pumping laser power makes no influence on the maximum hoop stress location, when the position of the laser beam is unchanged. The thermal damage investigation indicates that the transparent ceramic Nd:YAG has greater resistance than thermal fracture and it is 64% higher than that of the crystals.
  • Keywords
    ceramics; laser beam effects; neodymium; optical materials; optical pumping; thermal conductivity; thermal stresses; yttrium compounds; YAG:Nd; continuous wave pump laser induced thermal damage; crystalline materials; end pumped rod; hoop stress location; laser beam position; polycrystalline ceramics; pump beam radius; pumping laser power; temperature gradient; thermal fracture; thermal resistance; transparent ceramics; wavelength 808 nm; Ceramics; Crystals; Laser beams; Laser excitation; Measurement by laser beam; Pump lasers; Temperature measurement; Ceramics; crystal; solid lasers; thermal resistance; thermal stress;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2014.2351791
  • Filename
    6883161