• DocumentCode
    460053
  • Title

    Correlation Between Device Performance and Photo-Generated Carriers Escape Order in III-V p-i-n Quantum Confined Solar Cells

  • Author

    Alemu, A. ; Coaquira, J.A.H. ; Freundlich, A.

  • Author_Institution
    Dept. of Phys., Houston Univ., TX
  • Volume
    1
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    59
  • Lastpage
    62
  • Abstract
    For p-i-n quantum confined solar cells, best efficiency trade-off is often achieved in the vicinity of a critical intrinsic region thickness corresponding to a critical built-in electric field. Nevertheless, even for devices satisfying such condition, the carrier escape sequence is shown to have a profound impact on device performance. Here, we present several correlations between photoluminescence and theoretical calculation results for studies made on specific devices. The study underlines the need to carefully consider carrier escape processes in order to achieve the goal of highly efficient quantum confined solar cell
  • Keywords
    III-V semiconductors; photoluminescence; semiconductor junctions; solar cells; III-V p-i-n quantum confined solar cells; critical built-in electric field; photogenerated carrier escape process; photoluminescence; Carrier confinement; Charge carrier processes; Circuits; Degradation; III-V semiconductor materials; Indium phosphide; Nanostructures; PIN photodiodes; Photovoltaic cells; Potential well;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    1-4244-0017-1
  • Electronic_ISBN
    1-4244-0017-1
  • Type

    conf

  • DOI
    10.1109/WCPEC.2006.279346
  • Filename
    4059561