• DocumentCode
    460085
  • Title

    Sputtered Cd1-xMgxTe Films for Top Cells in Tandem Devices

  • Author

    Mathew, X. ; Drayton, J. ; Parikh, V. ; Compaan, A.D.

  • Author_Institution
    Dept. of Phys. & Astron., Toledo Univ., OH
  • Volume
    1
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    321
  • Lastpage
    326
  • Abstract
    Cd1-xMgxTe is a potential candidate for the top cell in two-terminal tandem solar cells. The close match of the lattice constant of MgTe with CdTe and the apparent complete miscibility of MgTe in CdTe and the rapid increase in band gap with Mg content gives flexibility to prepare material with the appropriate band gap for current-matching in a tandem solar cell. We have chosen to deposit Cd 1-xMgxTe thin films by RF sputtering to maintain access to low growth temperatures. Substrate temperatures greater than 250degC produced highly adhering polycrystalline films with grain size in the range of 100-150 nm and a strong preferential (111) orientation. All the films were p-type and resistive. Energy Dispersive X-ray Spectroscopy (EDS) analysis showed that the Mg concentration in the film is significantly lower than that of the source target. Films were chloride-treated at temperatures in the range 350 to 387degC in a variety of ambients and the band gap showed narrowing at higher annealing temperature and time duration, particularly in oxygen containing ambients. XRD and AFM studies of the Cd1-xMgx Te films showed evidence of re-crystallization including grain growth and a more random crystallographic orientation of the grains. Prototype CdS/Cd1-xMgxTe solar cells were fabricated
  • Keywords
    II-VI semiconductors; X-ray chemical analysis; X-ray diffraction; annealing; atomic force microscopy; cadmium compounds; crystal orientation; energy gap; grain growth; grain size; lattice constants; magnesium compounds; recrystallisation; semiconductor thin films; solar cells; sputter deposition; texture; 350 to 387 C; AFM; Cd1-xMgxTe; EDS; X-ray diffraction; XRD; annealing; atomic force microscopy; band gap; energy dispersive X-ray spectroscopy; grain growth; grain size; lattice constant; polycrystalline films; preferential orientation; radiofrequency sputtered films; random crystallographic orientation; recrystallization; top cells; two-terminal tandem solar cells; Dispersion; Grain size; Lattices; Photonic band gap; Photovoltaic cells; Radio frequency; Sputtering; Substrates; Tellurium; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    1-4244-0017-1
  • Electronic_ISBN
    1-4244-0017-1
  • Type

    conf

  • DOI
    10.1109/WCPEC.2006.279456
  • Filename
    4059629