• DocumentCode
    460101
  • Title

    Development of Low Temperature Approaches to Device Quality Cadmium Sulfide: a Novel Geometry for Solution Growth of Thin Films and Their Characterization

  • Author

    Archbold, M.D. ; Halliday, D.P. ; Durose, K. ; Hase, T.P.A. ; Boyle, D.S. ; Mazzamuto, S. ; Romeo, N. ; Bosio, A.

  • Author_Institution
    Dept. of Phys., Durham Univ.
  • Volume
    1
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    438
  • Lastpage
    441
  • Abstract
    Cadmium sulfide thin films have been grown using a modified chemical bath deposition method with four innovative features: i) ethylenediamine was used as the complexing agent, enabling the use of low cadmium concentrations, ii) a rectangular bath geometry with heated glass plate walls was employed, iii) a low deposition temperature (30degC) was used and iv) nitrogen gas was flowed over the substrate surface during growth. The latter two features eliminate the formation and adherence of gas bubbles on the substrate during growth, hence reducing pinhole formation. On inspection, films were found to be specularly reflective and homogeneous with no visible pinholes. Characterization was performed by atomic force microscopy, grazing incidence X-ray diffraction, optical transmittance and photoluminescence spectroscopy. It was shown that films possessed a low surface roughness value of 5.2 nm, were highly crystalline, textured, had a grain size of 15 nm and a bandgap of 2.42 eV. Preliminary results from CdTe/CdS thin film photovoltaic devices demonstrate a notable efficiency of 9.8%
  • Keywords
    II-VI semiconductors; X-ray diffraction; adhesion; atomic force microscopy; bubbles; cadmium compounds; energy gap; glass; grain size; light transmission; liquid phase deposition; photoluminescence; semiconductor growth; semiconductor thin films; solar cells; surface roughness; texture; 30 C; 5.2 nm; CdS; CdTe-CdS; adherence; atomic force microscopy; bandgap; cadmium concentrations; chemical bath deposition method; complexing agent; crystalline surface roughness; device quality cadmium sulfide thin films; ethylenediamine; gas bubbles; glass plate walls; grain size; grazing incidence X-ray diffraction; nitrogen gas; optical transmittance; photoluminescence spectroscopy; pinhole formation; rectangular bath geometry; solar cells; solution growth; substrate surface; texture; thin film photovoltaic devices; Atom optics; Atomic force microscopy; Cadmium compounds; Geometry; Grain size; Optical films; Optical microscopy; Substrates; Temperature; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    1-4244-0017-1
  • Electronic_ISBN
    1-4244-0017-1
  • Type

    conf

  • DOI
    10.1109/WCPEC.2006.279484
  • Filename
    4059657