• DocumentCode
    460328
  • Title

    Optically Transparent Electrodes for Photoresponse Enhancement of MSM Photodetector

  • Author

    Budianu, Elena ; Purica, Munizer ; Iacomi, Felicia ; Baban, C.

  • Author_Institution
    National Inst. for R&D in Microtechnologies, IMT-Bucharest, Bucharest
  • Volume
    1
  • fYear
    2006
  • fDate
    27-29 Sept. 2006
  • Firstpage
    137
  • Lastpage
    140
  • Abstract
    The paper presents the obtaining of transparent conducting ZnO thin layers and their application as interdigitated transparent Schottky electrodes in a silicon based metal-semiconductor-metal (MSM-PD) photodiode structure. Optically transparent electrodes from impurity-doped ZnO thin layers have been prepared by vacuum thermal deposition method from metallic powders of Zn, Al and Sn followed by oxidation at 623K. The optical properties, investigated by spectro-photometry, show a high transparency (T>85%) over a large spectral range 0.4-1mum and from electrical properties measurements a low resistivity of <10-4 resulted. These TCO layers have been deposited on silicon epitaxial wafers and MSM-PD with interdigitated transparent ZnO electrodes was achieved. An enhanced responsivity, was obtained by eliminating the surface shadowing by opaque electrodes. The measured capacitance of 1.4pF assures a high speed response in the GHz range
  • Keywords
    aluminium; electrodes; metal-semiconductor-metal structures; photodetectors; photodiodes; semiconductor thin films; silicon; spectrophotometry; tin; wide band gap semiconductors; zinc compounds; 1.4 pF; 623 K; Al; MSM photodetector; Si; Sn; TCO layers; ZnO; interdigitated transparent Schottky electrodes; metal-semiconductor-metal photodiode structure; metallic powders; optical transparent electrodes; photoresponse enhancement; semiconductor thin layers; silicon epitaxial wafers; spectro-photometry; vacuum thermal deposition; Electric variables measurement; Electrodes; High speed optical techniques; Oxidation; Photodetectors; Photodiodes; Powders; Silicon; Tin; Zinc oxide; MSM photodetector; TCO; ZnO;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Semiconductor Conference, 2006
  • Conference_Location
    Sinaia
  • Print_ISBN
    1-4244-0109-7
  • Type

    conf

  • DOI
    10.1109/SMICND.2006.283951
  • Filename
    4063178