DocumentCode :
460328
Title :
Optically Transparent Electrodes for Photoresponse Enhancement of MSM Photodetector
Author :
Budianu, Elena ; Purica, Munizer ; Iacomi, Felicia ; Baban, C.
Author_Institution :
National Inst. for R&D in Microtechnologies, IMT-Bucharest, Bucharest
Volume :
1
fYear :
2006
fDate :
27-29 Sept. 2006
Firstpage :
137
Lastpage :
140
Abstract :
The paper presents the obtaining of transparent conducting ZnO thin layers and their application as interdigitated transparent Schottky electrodes in a silicon based metal-semiconductor-metal (MSM-PD) photodiode structure. Optically transparent electrodes from impurity-doped ZnO thin layers have been prepared by vacuum thermal deposition method from metallic powders of Zn, Al and Sn followed by oxidation at 623K. The optical properties, investigated by spectro-photometry, show a high transparency (T>85%) over a large spectral range 0.4-1mum and from electrical properties measurements a low resistivity of <10-4 resulted. These TCO layers have been deposited on silicon epitaxial wafers and MSM-PD with interdigitated transparent ZnO electrodes was achieved. An enhanced responsivity, was obtained by eliminating the surface shadowing by opaque electrodes. The measured capacitance of 1.4pF assures a high speed response in the GHz range
Keywords :
aluminium; electrodes; metal-semiconductor-metal structures; photodetectors; photodiodes; semiconductor thin films; silicon; spectrophotometry; tin; wide band gap semiconductors; zinc compounds; 1.4 pF; 623 K; Al; MSM photodetector; Si; Sn; TCO layers; ZnO; interdigitated transparent Schottky electrodes; metal-semiconductor-metal photodiode structure; metallic powders; optical transparent electrodes; photoresponse enhancement; semiconductor thin layers; silicon epitaxial wafers; spectro-photometry; vacuum thermal deposition; Electric variables measurement; Electrodes; High speed optical techniques; Oxidation; Photodetectors; Photodiodes; Powders; Silicon; Tin; Zinc oxide; MSM photodetector; TCO; ZnO;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
International Semiconductor Conference, 2006
Conference_Location :
Sinaia
Print_ISBN :
1-4244-0109-7
Type :
conf
DOI :
10.1109/SMICND.2006.283951
Filename :
4063178
Link To Document :
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