Title :
Innovation Performance Measurement: Expert vs. Practitioner Views
Author :
Birchall, David W. ; Tovstiga, George
Author_Institution :
Henley Manage. Coll.
Abstract :
Innovation presents many challenges to organisations, one of the trickiest being its measurement. However, the old saying ´If you can´t measure it you can´t manage it´ emphasises the importance of performance measurement to enable effective management. This seems to be essential in developing the innovation path, although many see it as a ´chaotic´ process. Previous research has produced a considerable number of potential metrics but only limited outcomes in relation to the challenges one has to face when trying to match the metrics framework to overall innovation strategies. Recent studies on practitioner experiences by the authors have resulted in five scales covering Future Focus, Market Impact, Capabilities and Image, Process, Sustainability and Overall Effectiveness. Dependent upon the firm´s primary purpose in measurement, different scales were emphasised. This research has also identified dilemmas facing those confronted with designing and justifying a measurement approach. The research reported here extends the earlier research by canvassing ´academic experts´ in innovation management and comparing and contrasting their views to those of practitioners. The reported outcomes should be of particular interest to those involved in delivering educational programmes and training in innovation management
Keywords :
education; innovation management; management training; technological forecasting; academic experts; chaotic process; educational programmes; effective management; expert views; firm primary purpose; future focus; innovation management; innovation performance measurement; market impact; metrics framework; practitioner views; sustainability; training; Chaos; Educational institutions; Focusing; Industrial training; Innovation management; Measurement; Performance analysis; Principal component analysis; Technological innovation; Testing;
Conference_Titel :
Technology Management for the Global Future, 2006. PICMET 2006
Conference_Location :
Istanbul
Print_ISBN :
1-890843-14-8
DOI :
10.1109/PICMET.2006.296620