Title :
The Application of the Neuro-Fuzzy Computing Technique for the Forecasting of the R&D Project Performance
Author :
Chen, Yu-Shan ; Chang, Ke-Chiun
Author_Institution :
Dept. of Bus. Adm., Nat. Yunlin Univ. of Sci. & Technol.
Abstract :
This study used the adaptive neuro-fuzzy inference system (ANFIS) and ordinary least squares (OLS) regression to forecast the R&D project performances of Taiwanese IC design companies through three explanatory variables: the fitness of project environment, R&D project manager´s skills, and the effectiveness of team work. The results showed that the accuracy rate of ANFIS in this study was 65.52% better than 55.17% of OLS regression model. Therefore, the ANFIS is more accurate than OLS regression to forecast the R&D project performance. Besides, this paper investigated the relationships between the R&D project performance and its determinants, and pointed out their nonlinear nature under the complex and uncertainty environment nowadays. This study showed that these three explanatory variables had inverse U-shaped effects on the R&D project performance with ANFIS which had more managerial implications than OLS regression which only indicated that these three explanatory variables were positively associated with the R&D project performance. Hence there existed optimal levels and U-shaped effects of these three determinants for the R&D project performance
Keywords :
adaptive systems; fuzzy neural nets; fuzzy reasoning; integrated circuit design; least squares approximations; project management; regression analysis; research and development management; ANFIS; R&D project performance; Taiwanese IC design companies; adaptive neuro-fuzzy inference system; artificial neural network; inverse U-shaped effects; managerial implications; neuro-fuzzy computing technique; ordinary least squares regression; team work; uncertainty environment; Artificial neural networks; Computer networks; Convergence; Environmental management; Performance evaluation; Project management; Research and development; Research and development management; Testing; Uncertainty;
Conference_Titel :
Technology Management for the Global Future, 2006. PICMET 2006
Conference_Location :
Istanbul
Print_ISBN :
1-890843-14-8
DOI :
10.1109/PICMET.2006.296812