DocumentCode :
461246
Title :
Relief Extraction of 3D Defaults on Specular Surfaces
Author :
Bavouzet, S. ; Laize, A.-S.C. ; Khoudeir, L.M. ; Bochard, J.
Author_Institution :
Lab. Signal, Image & Commun., Poitiers Univ.
Volume :
1
fYear :
2006
fDate :
9-13 July 2006
Firstpage :
667
Lastpage :
670
Abstract :
Within the framework of the analysis of 3D textured environment through image analysis, we approach here the case of the rough surfaces with different photometric behaviour, for the analysis of the local variations of their relief. The studied surfaces are metallic and can include some local defaults which can be considered as having a Lambertian photometric behaviour. We propose here to detect, in a first step, the 2D localization of the default through image analysis. The localization method is based upon an unsupervised segmentation algorithm within the context of transferable belief model. Our iterative algorithm automatically segments the metallic plates onto regions. As the local defaults can be considered as macro-texture, our segmentation method succeeds to isolate this particular region of interest. In a second step, we propose an original adaptation of stereovision based on photometric model to the case of surfaces with different photometric behaviour. So, we clarify the incidence of these phenomena on the image grey level and then on the relief extraction technique. The suggested method is then used to characterize default with 2D resolution about 10times10 mum2 and about 100 mum depth
Keywords :
image colour analysis; image resolution; image segmentation; image texture; iterative methods; photometry; 2D localization; 2D resolution; 3D defaults; 3D textured environment; Lambertian photometric behaviour; image analysis; image grey level; iterative algorithm; metallic plates; photometric behaviour; photometric model; relief extraction technique; rough surfaces; specular surfaces; stereovision; unsupervised segmentation algorithm; Image analysis; Image databases; Image segmentation; Image texture analysis; Iterative algorithms; Photometry; Rough surfaces; Signal analysis; Surface roughness; Surface texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2006 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0496-7
Electronic_ISBN :
1-4244-0497-5
Type :
conf
DOI :
10.1109/ISIE.2006.295540
Filename :
4078009
Link To Document :
بازگشت