• DocumentCode
    461337
  • Title

    Classifying Bad Chips and Ordering Test Sets

  • Author

    Ferhani, Francois-Fabien ; McCluskey, Edward J.

  • Author_Institution
    Center for Reliable Comput., Stanford Univ., CA
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper shows data related to choosing a pair of test sets for digital IC production test. This data demonstrates that the choice of the second set of the pair should take into account the test metric used for the first test set. An approach for making this choice by taking defect coverage and total test length into account is presented
  • Keywords
    integrated circuit testing; production testing; bad chips classification; digital IC production test; test sets; CMOS technology; Circuit faults; Circuit testing; Digital integrated circuits; Fault detection; Integrated circuit testing; Integrated circuit yield; Large scale integration; Production; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297736
  • Filename
    4079414
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=461337