Title :
Measurement of the Noise Figure and Admittance of InP Transferred Electron Amplifying Devices
Author :
Braddock, P.W. ; Gray, K.W. ; Hodges, R.D.
Author_Institution :
Royal Radar Establishment, Great Malvern, UK
Keywords :
Admittance measurement; Circuit noise; Coaxial components; Electrons; Frequency measurement; Indium phosphide; Noise figure; Noise measurement; Pulse amplifiers; Pulse measurements;
Conference_Titel :
Microwave Conference, 1973. 3rd European
Conference_Location :
Brussels, Belgium
DOI :
10.1109/EUMA.1973.331589