• DocumentCode
    461846
  • Title

    Pin Diode Limiter Dynamics

  • Author

    Garver, R. ; Reggia, F. ; Callow, R.

  • Author_Institution
    Harr Diamond Laboratories, Washington D.C. 20438
  • Volume
    1
  • fYear
    1973
  • fDate
    4-7 Sept. 1973
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Theory and experiments are presented relating PIN diode junction properties to limit level, spike leakage, and recovery.
  • Keywords
    Circuits; Costs; Diodes; Electrons; Frequency; Laboratories; Manufacturing processes; Microwave devices; Microwave theory and techniques; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1973. 3rd European
  • Conference_Location
    Brussels, Belgium
  • Type

    conf

  • DOI
    10.1109/EUMA.1973.331600
  • Filename
    4130183
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=461846