Title :
Pin Diode Limiter Dynamics
Author :
Garver, R. ; Reggia, F. ; Callow, R.
Author_Institution :
Harr Diamond Laboratories, Washington D.C. 20438
Abstract :
Theory and experiments are presented relating PIN diode junction properties to limit level, spike leakage, and recovery.
Keywords :
Circuits; Costs; Diodes; Electrons; Frequency; Laboratories; Manufacturing processes; Microwave devices; Microwave theory and techniques; Testing;
Conference_Titel :
Microwave Conference, 1973. 3rd European
Conference_Location :
Brussels, Belgium
DOI :
10.1109/EUMA.1973.331600
