DocumentCode :
461871
Title :
Computerized Microwave Measurements Accuracy Analysis
Author :
Ridella, S.
Author_Institution :
Laboratorio per i Circuiti Elettronici Istituto di Elettrotecnica, Viale Cambiaso, 6 - 16145 Genova, Italy
Volume :
1
fYear :
1973
fDate :
4-7 Sept. 1973
Firstpage :
1
Lastpage :
4
Keywords :
Calibration; Circuit analysis computing; Costs; Laboratories; Microwave circuits; Microwave measurements; Particle measurements; Performance analysis; Performance evaluation; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1973. 3rd European
Conference_Location :
Brussels, Belgium
Type :
conf
DOI :
10.1109/EUMA.1973.331669
Filename :
4130226
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=461871
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