DocumentCode :
462314
Title :
Measurement of the Trapping Time Constants in Neutron-Irradiated Silicon Pad Detectors
Author :
Weber, Jens ; Klingenberg, Reiner
Author_Institution :
Dortmund Univ.
Volume :
1
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
143
Lastpage :
147
Abstract :
Silicon pad-detectors fabricated from oxygenated silicon were irradiated with reactor neutrons with fluences between 1 middot 1014 neq/cm2 and 4 middot 1015 neq/cm2. The transient current technique was used to measure the trapping probability for holes and electrons. The measured trapping probabilities scale linearly with the fluence.
Keywords :
electron traps; elemental semiconductors; hole traps; neutron effects; sensors; silicon; silicon radiation detectors; Si; electron trapping; hole trapping; neutron irradiated silicon pad detectors; transient current technique; trapping probability; trapping time constant; Charge carrier processes; Charge carriers; Current measurement; Detectors; Electrodes; Electron traps; Large Hadron Collider; Neutrons; Silicon; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.356126
Filename :
4178965
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=462314
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