• DocumentCode
    462314
  • Title

    Measurement of the Trapping Time Constants in Neutron-Irradiated Silicon Pad Detectors

  • Author

    Weber, Jens ; Klingenberg, Reiner

  • Author_Institution
    Dortmund Univ.
  • Volume
    1
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    143
  • Lastpage
    147
  • Abstract
    Silicon pad-detectors fabricated from oxygenated silicon were irradiated with reactor neutrons with fluences between 1 middot 1014 neq/cm2 and 4 middot 1015 neq/cm2. The transient current technique was used to measure the trapping probability for holes and electrons. The measured trapping probabilities scale linearly with the fluence.
  • Keywords
    electron traps; elemental semiconductors; hole traps; neutron effects; sensors; silicon; silicon radiation detectors; Si; electron trapping; hole trapping; neutron irradiated silicon pad detectors; transient current technique; trapping probability; trapping time constant; Charge carrier processes; Charge carriers; Current measurement; Detectors; Electrodes; Electron traps; Large Hadron Collider; Neutrons; Silicon; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.356126
  • Filename
    4178965
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=462314