• DocumentCode
    462315
  • Title

    Radiation Tolerance of High-Resistivity LBNL CCDs

  • Author

    Dawson, Kyle ; Bebek, Chris ; Ernes, J. ; Holland, Steve ; Jelinsky, Sharon ; Karcher, Armin ; Kolbe, William ; Palaio, Nick ; Roe, Natalie ; Takasaki, Koki ; Wang, Guobin

  • Author_Institution
    Lawrence Berkeley Nat. Lab., CA
  • Volume
    1
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    152
  • Lastpage
    157
  • Abstract
    Thick, fully-depleted p-channel charge-coupled devices (CCDs) have been developed at the Lawrence Berkeley National Laboratory (LBNL). These CCDs have several advantages over conventional n-channel CCDs, including enhanced quantum efficiency and reduced fringing at near-infrared wavelengths, a small point spread function, and improved radiation tolerance. Here we report results from the irradiation of CCDs with 12.5 and 55 MeV protons at the LBNL 88-Inch Cyclotron. These studies indicate that the CCDs still perform well after irradiation, even in the parameters in which significant degradation is expected: charge transfer efficiency, dark current, and isolated hot pixels. As expected, the radiation tolerance of the LBNL CCDs is significantly improved over conventional n-channel CCDs currently employed in space-based telescopes such as the Hubble Space Telescope (HST).
  • Keywords
    CCD image sensors; radiation effects; HST; Hubble Space Telescope; LBNL 88-Inch Cyclotron; Lawrence Berkeley National Laboratory; charge transfer efficiency; dark current; high resistivity CCD; isolated hot pixels; n-channel CCD; p-channel charge-coupled devices; quantum efficiency; radiation tolerance; small point spread function; space based telescopes; Charge coupled devices; Charge transfer; Cyclotrons; Dark current; Degradation; Instruments; Laboratories; Protons; Silicon; Telescopes; Astrophysics and Space Instrumentation; Radiation Damage Effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.356128
  • Filename
    4178967