DocumentCode :
462372
Title :
Design and Performance of the Alignment System for the CMS Muon Endcaps
Author :
Hohlmann, Marcus ; Baksay, Gyongyi ; Browngold, Max ; Dehmelt, Klaus ; Guragain, Samir ; Andreev, Valery ; Yang, Xiaofeng ; Bellinger, James ; Carlsmith, Duncan ; Feyzi, Farshid ; Loveless, Richard J. ; Northacker, David ; Case, Michael ; Eartly, David P.
Author_Institution :
Dept. of Phys. & Space Sci., Florida Inst. of Technol., Melbourne, FL
Volume :
1
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
489
Lastpage :
495
Abstract :
The alignment system for the CMS muon endcap detector employs several hundred sensors such as optical 1-D CCD sensors illuminated by lasers and analog distance- and tilt-sensors to monitor the positions of one sixth of 468 large cathode strip chambers. The chambers mounted on the endcap yoke disks undergo substantial deformation on the order of centimeters when the 4 T field is switched on and off. The muon endcap alignment system is required to monitor chamber positions with 75-200 mum accuracy in the Rphi plane, ~400 mum in the radial direction, and ~1 mm in the z-direction along the beam axis. The complete alignment hardware for one of the two endcaps has been installed at CERN. A major system test was performed when the 4 T solenoid magnet was ramped up to full field for the first time in August 2006. We present the overall system design and first results on disk deformations, which indicate that the measurements agree with expectations.
Keywords :
CCD image sensors; muon detection; position control; position sensitive particle detectors; CERN; CMS Muon Endcap detector; CMS muon endcap alignment system; alignment hardware; alignment system design; alignment system performance; analog distance sensor; analog tilt sensor; cathode strip chambers; chamber position monitoring; compact muon solenoid; endcap yoke disk deformations; optical 1D CCD sensors; Cathodes; Charge coupled devices; Collision mitigation; Hardware; Mesons; Monitoring; Optical sensors; Sensor systems; Strips; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.356204
Filename :
4179043
Link To Document :
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