Title :
Microradiographic Observation of Material Damage Structure
Author :
Vavrik, Daniel ; Holy, Tomas ; Jakubek, Jan ; Jakubek, Martin ; Vykydal, Zdenek
Author_Institution :
Inst. of Theor. & Appl. Mech., Czech Acad. of Sci., Prague
fDate :
Oct. 29 2006-Nov. 1 2006
Abstract :
Failures in ductile and composite materials precede intensive internal material damage evolution. Not only the onset and existence of damage but also its quantification and time evolution have to be determined with micrometric accuracy for material science research. The proposed experimental system includes the advantage of simplicity of the use and low cost operation compared to the cost and size of synchrotron facilities, which are up to day used for this kind of material science studies.
Keywords :
X-ray applications; flaw detection; internal material damage evolution; material damage structure; material science research; microradiography; Calibration; Composite materials; Costs; Materials science and technology; Object detection; Position measurement; Radiography; Thickness measurement; X-ray detection; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2006.356034