• DocumentCode
    462492
  • Title

    Evaluation of a Junction Termination Extension APD for Use with Scintillators

  • Author

    Gramsch, Ernesto ; Pcheliakov, Oleg P. ; Chistokhin, Igor B. ; Tishkovsky, E.

  • Author_Institution
    Dept. of Phys., Santiago Univ.
  • Volume
    2
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    1220
  • Lastpage
    1223
  • Abstract
    An avalanche photodiode with a new type of ring structure around the active area was built. The junction termination extension (JTE) APD has three diffused rings around the main junction to reduce the electric field and obtain near ideal breakdown voltage. This design has the advantage that it does not need a sharp bevel edge or grooves to avoid early breakdown at the surface. The JTE rings can be obtained by well controlled single ion-implantation through a single mask. Photodetectors with 2 mm diameter active area have been built by implantation of boron with a dose of 2, 3, 4 and 5 times 1012 cm-2, followed by deep diffusion to 14 mum. The dark current is strongly dependent on the implantation charge, decreasing with decreasing charge. For the APDs with implanted dose of 5 times 1012 cm-2 a gain of 8 is obtained at 1120 V. The energy resolution of an APD coupled to a BGO scintillator from a 137Cs gamma-ray source was measured to be 24.4%. We have also performed simulations of the gain and breakdown voltage that correlate well with the results.
  • Keywords
    avalanche photodiodes; electric breakdown; scintillation; scintillation counters; 1120 V; 137Cs gamma-ray source; BGO scintillator; avalanche photodiode; breakdown voltage; dark current; diffusion; electric field; implantation charge; ion implantation; junction termination extension APD; photodetectors; Avalanche photodiodes; Boron; Dark current; Electric breakdown; Energy measurement; Energy resolution; Gain measurement; Nuclear and plasma sciences; Photodetectors; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.356064
  • Filename
    4179218