Title :
Validation of Geant4 Atomic Relaxation against the NIST reference data
Author :
Guatelli, S. ; Mantero, A. ; Mascialino, B. ; Pia, M.G. ; Zampichelli, V.
Author_Institution :
Sezione di Genova, INFN, Genova
fDate :
Oct. 29 2006-Nov. 1 2006
Abstract :
The validation of Geant4 with respect to authoritative reference data is a critical issue, fundamental to establish the predictive capabilities of Geant4-based simulations. We present the results of a series of comparisons for the evaluation of Geant4 atomic relaxation package with respect to the National Institute of Standards and Technologies (NIST) reference data.
Keywords :
Auger electron spectra; X-ray emission spectra; Geant4 atomic relaxation; NIST; National Institute of Standards and Technologies; Atomic layer deposition; Atomic measurements; Databases; Electron emission; Fluorescence; NIST; Packaging; Physics; Software libraries; System testing; Geant4; Monte Carlo; hadrontherapy; radiation protection; validation;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2006.354186
