Title :
Multi-grid 3D-OSEM reconstruction technique for high resolution rotating-head PET scanners
Author :
Ortuno, Juan E. ; Rubio, Jose L. ; Guerra, Pedro ; Kontaxakis, George ; Santos, Andres
Author_Institution :
Dept. of Electron. Eng., Univ. Politecnica de Madrid
fDate :
Oct. 29 2006-Nov. 1 2006
Abstract :
A fast statistical iterative image reconstruction algorithm has been developed for high resolution PET scanners based on rotating plane detectors. The proposed technique consists of a multi-grid version of the 3D ordered subsets expectation-maximization (3D-OSEM) algorithm. The associated system matrix is precalculated for the fine grid resolution with Monte Carlo methods. Coarse grid system matrices and subset subdivision are derived at a post-process step. Only the system matrix elements associated to the fourth part of central transverse planes are stored in sparse mode format, using axial and in-plane transaxial symmetries during the reconstruction. The multi-grid proposed technique has been evaluated on 3D sinograms obtained from GATE simulations, reporting better resolution-noise trade-off than SSRB+2D-OSEM and FORE+2D-OSEM algorithms, specially in the axial direction and far from the center of the FOV. The proposed algorithm shows significantly faster convergence rate than single-grid 3D-OSEM when is applied to images with local smoothness property.
Keywords :
Monte Carlo methods; image reconstruction; medical image processing; positron emission tomography; 3D ordered subsets expectation maximization algorithm; FORE+2D-OSEM algorithm; GATE simulation; Monte Carlo method; SSRB+2D-OSEM algorithm; fast statistical iterative image reconstruction algorithm; high resolution rotating head PET scanners; multigrid 3D OSEM reconstruction technique; rotating plane detectors; Cameras; Convergence; Detectors; Frequency; Image reconstruction; Image resolution; Iterative algorithms; Positron emission tomography; Sparse matrices; Transmission line matrix methods;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2006.354354