• DocumentCode
    462878
  • Title

    High Voltage Breakdown Performance and Circuit Isolation Capability of Vacuum Interrupters

  • Author

    Taylor, Erik D. ; Slade, Paul G.

  • Author_Institution
    Eaton Electr., Horseheads, NY
  • Volume
    1
  • fYear
    2006
  • fDate
    25-29 Sept. 2006
  • Firstpage
    208
  • Lastpage
    211
  • Abstract
    High voltage breakdown experiments determined the ability of vacuum interrupters to provide adequate circuit isolation in the open position. The vacuum interrupters were rated for a 38kV system voltage, and contained either Cu-W (10 wt.%) or Cu-Cr contacts. Sample interrupters were voltage conditioned with a peak AC voltage of 160kV. The statistical distribution of the BIL breakdown voltage for 3 and 5 mm contact gaps were determined using the up-down method for newly conditioned contacts. A three-parameter Weibull distribution fit the breakdown data, implying the existence of a threshold value below which no breakdowns occurs. These results are discussed in terms of the high voltage capabilities of Cu-W contacts and with respect of the peak open-circuit voltages for typical 38 kV applications. The vacuum breakdown behavior is also compared to the breakdown in SF6
  • Keywords
    Weibull distribution; chromium; circuit-breaking arcs; copper; tungsten; vacuum breakdown; vacuum interrupters; 160 kV; 3 mm; 38 kV; 5 mm; BIL breakdown; Cu-Cr; Cu-W; Weibull distribution; circuit isolation capability; contact gaps; high voltage breakdown performance; high voltage capabilities; newly conditioned contacts; peak open-circuit voltages; up-down method; vacuum breakdown; vacuum interrupters; Breakdown voltage; Circuits; Contacts; Dielectric breakdown; Interrupters; Probability; Switches; Testing; Vacuum breakdown; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
  • Conference_Location
    Matsue
  • ISSN
    1093-2941
  • Print_ISBN
    1-4244-0191-7
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2006.357269
  • Filename
    4194849