DocumentCode
463293
Title
Application of Flowgraph Techniques to the Solution of Reliability Problems
Author
Happ, W.W
Author_Institution
Hughes Semiconductor Division, New Port Beach, California; Arizona State University, Tempe, Arizona
fYear
1963
fDate
Sept. 1963
Firstpage
375
Lastpage
423
Keywords
Current density; Equations; Failure analysis; Mathematical model; Mechanical factors; Pattern analysis; Physics; Semiconductor device reliability; Space charge; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1963. Second Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1963.362257
Filename
4207608
Link To Document