• DocumentCode
    463479
  • Title

    Quality Assessment of Non-Rigid Registration Methods for Atlas-Based Segmentation in Head-Neck Radiotherapy

  • Author

    Parraga, A. ; Susin, A. ; Pettersson, Jonas ; Macq, B. ; De Craene, Mathieu

  • Author_Institution
    Dept. Electr. Eng., UFRGS, Porto Alegre, Brazil
  • Volume
    1
  • fYear
    2007
  • fDate
    15-20 April 2007
  • Abstract
    In this paper we compare three non-rigid registration methods for atlas-based segmentation: B-splines, morphons and a combination of morphons and demons. To assess the quality of each method, we use a data set of four patients, containing for each patient the computed tomography (CT) image and a manual segmentation of the organs at risk performed by an expert of the head and neck anatomy. Non-rigid registration algorithms have been used to match the patient and atlas images. Each deformation field, resulting from the non-rigid deformation, have been applied on the masks corresponding to segmented regions in the atlas. The atlas based segmented masks have been compared to manual segmentations performed by the expert. The results show that the combined method (morphons + demons) achieves the best performances on this dataset resulting in an average improvement of 6% with respect to morphons and 18% with respect to B-spline.
  • Keywords
    computerised tomography; image matching; image registration; image segmentation; medical image processing; radiation therapy; splines (mathematics); B-splines; CT image; atlas-based segmentation; computed tomography image; head-neck radiotherapy; image matching; morphons; nonrigid deformation; nonrigid registration methods; quality assessment; Anatomy; Computed tomography; Head; Image registration; Image segmentation; Medical treatment; Neck; Neoplasms; Quality assessment; Spline; biomedical imaging processing; image registration; image segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 2007. ICASSP 2007. IEEE International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1520-6149
  • Print_ISBN
    1-4244-0727-3
  • Type

    conf

  • DOI
    10.1109/ICASSP.2007.366712
  • Filename
    4217112