• DocumentCode
    464675
  • Title

    Simulation and Validation of CNT Mechanical Properties - The Future Interconnection Material

  • Author

    Wu, Chung-Jung ; Chou, Chan-Yen ; Han, Cheng-Nan ; Chiang, Kuo-Ning

  • Author_Institution
    Nat. Tsing Hua Univ., Hsinchu
  • fYear
    2007
  • fDate
    May 29 2007-June 1 2007
  • Firstpage
    447
  • Lastpage
    452
  • Abstract
    The notable material properties of carbon nanotubes (CNTs) with ballistic electrical transport, ultrahigh Young´s modulus and thermal conductivity made them very attractive for microelectronic interconnections, thermal management and nanoscale device applications. This paper will focus on the analysis of mechanical properties of single-walled carbon nanotubes (SWCNTs). In our research, the atomistic-continuum mechanics (ACM) was applied to investigate the mechanical properties of SWCNTs. By establishing a linkage between structural mechanics and molecular mechanics, not only the Young´s moduli could be obtained but also the modal analysis could be achieved. In addition, according to atomistic-continuum mechanics and finite element method, an effective atomistic-continuum model is constructed to investigate the above two mechanical properties of SWCNTs with affordable computational time by personal computers. The validity of the results is demonstrated by comparing them with existing results. Furthermore, the ACM could provide an efficient method in the analysis of mechanical properties of the CNTs-refined electronic packaging structure.
  • Keywords
    Young´s modulus; carbon nanotubes; continuum mechanics; finite element analysis; thermal management (packaging); CNT mechanical properties; atomistic-continuum mechanics; ballistic electrical transport; electronic packaging structure; finite element method; interconnection material; microelectronic interconnections; molecular mechanics; nanoscale device applications; single-walled carbon nanotubes; structural mechanics; thermal conductivity; thermal management; ultrahigh Young´s modulus; Carbon nanotubes; Conducting materials; Couplings; Material properties; Mechanical factors; Microelectronics; Modal analysis; Nanoscale devices; Thermal conductivity; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
  • Conference_Location
    Reno, NV
  • ISSN
    0569-5503
  • Print_ISBN
    1-4244-0985-3
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2007.373835
  • Filename
    4249921