DocumentCode
464675
Title
Simulation and Validation of CNT Mechanical Properties - The Future Interconnection Material
Author
Wu, Chung-Jung ; Chou, Chan-Yen ; Han, Cheng-Nan ; Chiang, Kuo-Ning
Author_Institution
Nat. Tsing Hua Univ., Hsinchu
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
447
Lastpage
452
Abstract
The notable material properties of carbon nanotubes (CNTs) with ballistic electrical transport, ultrahigh Young´s modulus and thermal conductivity made them very attractive for microelectronic interconnections, thermal management and nanoscale device applications. This paper will focus on the analysis of mechanical properties of single-walled carbon nanotubes (SWCNTs). In our research, the atomistic-continuum mechanics (ACM) was applied to investigate the mechanical properties of SWCNTs. By establishing a linkage between structural mechanics and molecular mechanics, not only the Young´s moduli could be obtained but also the modal analysis could be achieved. In addition, according to atomistic-continuum mechanics and finite element method, an effective atomistic-continuum model is constructed to investigate the above two mechanical properties of SWCNTs with affordable computational time by personal computers. The validity of the results is demonstrated by comparing them with existing results. Furthermore, the ACM could provide an efficient method in the analysis of mechanical properties of the CNTs-refined electronic packaging structure.
Keywords
Young´s modulus; carbon nanotubes; continuum mechanics; finite element analysis; thermal management (packaging); CNT mechanical properties; atomistic-continuum mechanics; ballistic electrical transport; electronic packaging structure; finite element method; interconnection material; microelectronic interconnections; molecular mechanics; nanoscale device applications; single-walled carbon nanotubes; structural mechanics; thermal conductivity; thermal management; ultrahigh Young´s modulus; Carbon nanotubes; Conducting materials; Couplings; Material properties; Mechanical factors; Microelectronics; Modal analysis; Nanoscale devices; Thermal conductivity; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373835
Filename
4249921
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