Title :
Noise Figure Measurement Using Mixed-Signal BIST
Author :
Qin, Jie ; Stroud, Charles ; Dai, Foster
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ.
Abstract :
A built-in self-test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixed-signal systems, is presented. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and a multiplier/accumulator based output response analyzer (ORA). The BIST approach has been implemented in hardware and used for actual NF measurements for comparison with measurements from external test equipment.
Keywords :
automatic test pattern generation; built-in self test; direct digital synthesis; electric noise measurement; frequency response; integrated circuit measurement; mixed analogue-digital integrated circuits; BIST approach; accumulator based output response analyzer; analog circuitry; built-in self-test approach; direct digital synthesizer; frequency response; mixed-signal BIST; mixed-signal systems; multiplier based output response analyzer; noise figure measurement; test pattern generator; Built-in self-test; Circuits; Frequency measurement; Frequency response; Linearity; Noise figure; Noise measurement; Pattern analysis; Synthesizers; Test pattern generators;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.378606
