Noise Figure Measurement Using Mixed-Signal BIST

Author

Qin, Jie ; Stroud, Charles ; Dai, Foster

Author_Institution

Dept. of Electr. & Comput. Eng., Auburn Univ.

fYear

2007

fDate

27-30 May 2007

Firstpage

2180

Lastpage

2183

Abstract

A built-in self-test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixed-signal systems, is presented. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and a multiplier/accumulator based output response analyzer (ORA). The BIST approach has been implemented in hardware and used for actual NF measurements for comparison with measurements from external test equipment.

Keywords

automatic test pattern generation; built-in self test; direct digital synthesis; electric noise measurement; frequency response; integrated circuit measurement; mixed analogue-digital integrated circuits; BIST approach; accumulator based output response analyzer; analog circuitry; built-in self-test approach; direct digital synthesizer; frequency response; mixed-signal BIST; mixed-signal systems; multiplier based output response analyzer; noise figure measurement; test pattern generator; Built-in self-test; Circuits; Frequency measurement; Frequency response; Linearity; Noise figure; Noise measurement; Pattern analysis; Synthesizers; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on

Conference_Location

New Orleans, LA

Print_ISBN

1-4244-0920-9

Electronic_ISBN

1-4244-0921-7

Type

conf

DOI

10.1109/ISCAS.2007.378606

Filename

4253104